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Distinction of intrinsic from extrinsic stacking faults in field-ion micrographs
Philosophical Magazine 19 (161):1083-1084 (1969)
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On distinguishing between intrinsic and extrinsic faults in field-ion micrographs.S. Ranganathan - 1969 - Philosophical Magazine 19 (158):415-419.
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Citations of this work
Characterization of stacking faults with the field-ion microscope.M. A. Fortes - 1970 - Philosophical Magazine 22 (176):317-327.
Observations of the fine structure of superdislocations in Ni3Al by field-ion microscopy.R. J. Taunt & B. Ralph - 1974 - Philosophical Magazine 30 (6):1379-1394.
References found in this work
Contrast from stacking faults and partial dislocations in the field-ion microscope.D. A. Smith, M. A. Fortes, A. Kelly & B. Ralph - 1968 - Philosophical Magazine 17 (149):1065-1077.
The analysis of field-ion micrographs: Stacking faults in tungsten.D. A. Smith & K. M. Bowkett - 1968 - Philosophical Magazine 18 (156):1219-1233.
On distinguishing between intrinsic and extrinsic faults in field-ion micrographs.S. Ranganathan - 1969 - Philosophical Magazine 19 (158):415-419.
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