- New
-
Topics
- All Categories
- Metaphysics and Epistemology
- Value Theory
- Science, Logic, and Mathematics
- Science, Logic, and Mathematics
- Logic and Philosophy of Logic
- Philosophy of Biology
- Philosophy of Cognitive Science
- Philosophy of Computing and Information
- Philosophy of Mathematics
- Philosophy of Physical Science
- Philosophy of Social Science
- Philosophy of Probability
- General Philosophy of Science
- Philosophy of Science, Misc
- History of Western Philosophy
- Philosophical Traditions
- Philosophy, Misc
- Other Academic Areas
- Journals
- Submit material
- More
A rapid method for obtaining electron microscope contrast maps of various lattice defects
Philosophical Magazine 22 (175):175-182 (1970)
Abstract
This article has no associated abstract. (fix it)Other Versions
No versions found
My notes
Similar books and articles
A study of the relationship between lattice fringes and lattice planes in electron microscope images of crystals containing defects.D. J. H. Cockayne, J. R. Parsons & C. W. Hoelke - 1971 - Philosophical Magazine 24 (187):139-153.
Observation of crystal defects using the scanning electron microscope.D. R. Clarke - 1971 - Philosophical Magazine 24 (190):973-979.
Lattice images of Nb22O54and V6O13in the 1000 kV electron microscope.Shigeo Hoeiuchi & Yoshio Matsui - 1974 - Philosophical Magazine 30 (4):777-787.
Electron microscope image profiles of planar defects in crystals.G. R. Booker & P. M. Hazzledine - 1967 - Philosophical Magazine 15 (135):523-527.
Stimulated migration of point defects due to electron bombardment in the electron microscope, and its possible effect on their clustering.R. S. Nelson - 1964 - Philosophical Magazine 10 (106):723-726.
Electron back-scattering patterns—A new technique for obtaining crystallographic information in the scanning electron microscope.J. A. Venables & C. J. Harland - 1973 - Philosophical Magazine 27 (5):1193-1200.
Electron microscope study of electrically active impurity precipitate defects in silicon.A. G. Cullis & L. E. Katz - 1974 - Philosophical Magazine 30 (6):1419-1443.
A relation between dark field electron micrographs of lattice defects.C. J. Ball - 1964 - Philosophical Magazine 9 (100):541-544.
Magnetic domain contrast in backscattered electron images obtained with a scanning electron microscope.T. Yamamoto, H. Nishizawa & K. Tsuno - 1976 - Philosophical Magazine 34 (2):311-325.
Electron microscope contrast of small atom clusters.C. R. Hall & R. L. Hines - 1970 - Philosophical Magazine 21 (174):1175-1186.
Analytics
Added to PP
2016-06-30
Downloads
25 (#869,013)
6 months
6 (#827,406)
2016-06-30
Downloads
25 (#869,013)
6 months
6 (#827,406)
Historical graph of downloads
Citations of this work
Systematic row and zone axis STEM defect image simulations.P. J. Phillips, M. J. Mills & M. De Graef - 2011 - Philosophical Magazine 91 (16):2081-2101.
Transmission electron microscopy study of complex planar faults in Ru–Al–0.5 at.% B.D. -C. Lu, M. De Graef & T. M. Pollock † - 2004 - Philosophical Magazine 84 (22):2317-2329.
References found in this work
Electron diffraction from crystals containing stacking faults: I.M. J. Whelan & P. B. Hirsch - 1957 - Philosophical Magazine 2 (21):1121-1142.
Effects of surface stress relaxation on the electron microscope images of dislocations normal to thin metal foils.W. J. Tunstall, P. B. Hirsch & J. Steeds - 1964 - Philosophical Magazine 9 (97):99-119.
PhilPapers logo by Andrea Andrews and Meghan Driscoll.
This site uses cookies and Google Analytics (see our terms & conditions for details regarding the privacy implications). Use of this site is subject to terms & conditions.
All rights reserved by The PhilPapers Foundation
Server: philpapers-web-667477cd97-sfdq8 dc2