The first electron back-scattered diffraction Kikuchi patterns and grain orientation maps were captured for pure n -phase Ce. The sample preparation technique used for electron back-scattered diffraction orientation mapping of this surface-reactive metal included ion sputtering the surface using a scanning Auger microprobe followed by vacuum transfer of the sample from the scanning Auger microprobe to the scanning electron microscope. The effect of ion sputtering on the microstructure as well as preliminary electron back-scattered diffraction microstructural characterization is presented. Based on (...) the sputtering data, the room-temperature diffusivity of O in n -Ce was estimated. (shrink)